Optical profilometers are gradually taking over from tactile measurement systems. In the foreseeable future, 2D parameters will remain relevant only where they provide enough information. A detailed 3D analysis of the entire sample's surface, for instance through optical surface metrology techniques such as TopMap white light interferometers, enables an intuitive presentation of measurement data.
This approach also allows for comprehensive evaluation possibilities, offering deeper insights and feedback on the manufacturing process.
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